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Spectroscopy

RIXS

(a) Resonant Inelastic X-ray Scattering (RIXS) map of La2Ti2O7. (b) extracted spectra of HR-XAS (red) and valence-to-core XES (blue). (c) FEFF calculated orbital contribution.

Resonant Inelastic X-ray Scattering (RIXS) measures both the energy and momentum change of scattered x-ray photons. 

RIXS is a fast developing experimental technique in which high energy x-ray photons scatter inelastically off matter. It is most sucessful for materials containing nitrogen, transition metals or rare earth metals. Application areas include microelectronics, nanostructure systems, superconductors and materials with strong electron correlations.

APPLICATION SECTORS

Energy
Advanced materials
Environment & Climate science
Chemistry

 

beamlines at the Swiss Light Source

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